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Secondary Ion Mass Spectrometry: Applications For Depth Prof…

Secondary Ion Mass Spectrometry: Applications For Depth Prof…

USD 65.61 USD
SKU: 0ks1WEe1
GTIN: 9781606505885
Condition: Brand New

Specifications

ISBN9781606505885
PublisherMomentum Press
Item Length9 in
Publication Year2015
TypeTextbook
FormatTrade Paperback
LanguageEnglish
Item Height0.6 in
AuthorFred Stevie
Item Weight23.5 Oz
Item Width6 in
Number Of Pages150 Pages

I like that this textbook includes practice problems with full answer keys.

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